Stress measurement by X-ray diffraction in multicrystalline silicon solar cells

V Popovich, NM van der Pers, M Janssen, IJ Bennett, IM Richardson

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 37th IEEE Photovoltaic Specialists Conference, Seattle, USA, 19-24 June 2011
Editors	s.n.
Place of Publication	s.l.
Publisher	IEEE Society
Pages	1-5
Number of pages	5
Publication status	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference - Seattle, United States Duration: 19 Jun 2011 → 24 Jun 2011 Conference number: 37

Name
Publisher	IEEE

Conference	37th IEEE Photovoltaic Specialists Conference
Abbreviated title	PVSC 2011
Country/Territory	United States
City	Seattle
Period	19/06/11 → 24/06/11

Keywords

@inproceedings{0d7b4fcd63614466b0a01f512b157745,

title = "Stress measurement by X-ray diffraction in multicrystalline silicon solar cells",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "V Popovich and {van der Pers}, NM and M Janssen and IJ Bennett and IM Richardson",

year = "2011",

language = "English",

publisher = "IEEE Society",

pages = "1--5",

editor = "s.n.",

booktitle = "Proceedings 37th IEEE Photovoltaic Specialists Conference, Seattle, USA, 19-24 June 2011",

note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

}

Popovich, V, van der Pers, NM, Janssen, M, Bennett, IJ & Richardson, IM 2011, Stress measurement by X-ray diffraction in multicrystalline silicon solar cells. in s.n. (ed.), Proceedings 37th IEEE Photovoltaic Specialists Conference, Seattle, USA, 19-24 June 2011. IEEE Society, s.l., pp. 1-5, 37th IEEE Photovoltaic Specialists Conference, Seattle, United States, 19/06/11.

Stress measurement by X-ray diffraction in multicrystalline silicon solar cells. / Popovich, V; van der Pers, NM; Janssen, M et al.
Proceedings 37th IEEE Photovoltaic Specialists Conference, Seattle, USA, 19-24 June 2011. ed. / s.n. s.l.: IEEE Society, 2011. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Stress measurement by X-ray diffraction in multicrystalline silicon solar cells

AU - Popovich, V

AU - van der Pers, NM

AU - Janssen, M

AU - Bennett, IJ

AU - Richardson, IM

N1 - Conference code: 37

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1

EP - 5

BT - Proceedings 37th IEEE Photovoltaic Specialists Conference, Seattle, USA, 19-24 June 2011

A2 - s.n., null

PB - IEEE Society

CY - s.l.

T2 - 37th IEEE Photovoltaic Specialists Conference

Y2 - 19 June 2011 through 24 June 2011

ER -