@inproceedings{874ef39b586d4ec89fa5a2578478b69a,
title = "Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.",
author = "AJ Kalkman and AH Verbruggen and GCAM Janssen",
year = "1999",
language = "Undefined/Unknown",
publisher = "American Institute of Physics",
pages = "265--270",
editor = "O Kraft and E Arzt and CA Volkert and PS Ho and H Okabayashi",
booktitle = "Proceedings 5th International Workshop on stress-induced phenomena in metallization.",
address = "United States",
}