TY - JOUR
T1 - Strong reduction of quasiparticle fluctuations in a superconductor due to decoupling of the quasiparticle number and lifetime
AU - De Rooij, Steven A.H.
AU - Baselmans, Jochem J.A.
AU - Murugesan, Vignesh
AU - Thoen, David J.
AU - De Visser, Pieter J.
PY - 2021
Y1 - 2021
N2 - We measure temperature-dependent quasiparticle fluctuations in a small Al volume, embedded in a NbTiN superconducting microwave resonator. The resonator design allows for readout close to equilibrium. By placing the Al film on a membrane, we enhance the fluctuation level and separate quasiparticle effects from phonon effects. When lowering the temperature, the recombination time saturates and the fluctuation level reduces by a factor ∼100. From this we deduce that the number of free quasiparticles is still thermal. Therefore, the theoretical, inverse relation between the quasiparticle number and recombination time is invalid in this experiment. This is consistent with quasiparticle trapping, where on-trap recombination limits the observed quasiparticle lifetime.
AB - We measure temperature-dependent quasiparticle fluctuations in a small Al volume, embedded in a NbTiN superconducting microwave resonator. The resonator design allows for readout close to equilibrium. By placing the Al film on a membrane, we enhance the fluctuation level and separate quasiparticle effects from phonon effects. When lowering the temperature, the recombination time saturates and the fluctuation level reduces by a factor ∼100. From this we deduce that the number of free quasiparticles is still thermal. Therefore, the theoretical, inverse relation between the quasiparticle number and recombination time is invalid in this experiment. This is consistent with quasiparticle trapping, where on-trap recombination limits the observed quasiparticle lifetime.
UR - http://www.scopus.com/inward/record.url?scp=85120679554&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.104.L180506
DO - 10.1103/PhysRevB.104.L180506
M3 - Article
AN - SCOPUS:85120679554
SN - 2469-9950
VL - 104
JO - Physical Review B
JF - Physical Review B
IS - 18
M1 - L180506
ER -