Structural and electro-optical properties of thin silicon films deposited in the protocrystalline growth regime

G van Elzakker, FD Tichelaar, M Zeman

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings of the STW annual workshop on semiconductor advances for future electronics and sensors (SAFE 2005)
Editors s.n.
Place of PublicationUtrecht
PublisherSTW Dutch Technoloy Foundation
Pages1-5
Number of pages5
ISBN (Print)90-73461-50-2
Publication statusPublished - 2005
Event8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2005) & 16th Annual Workshop on Circuits, Systems and Signal Processing (ProRisc 2005); Veldhoven,The Netherlands - Utrecht
Duration: 17 Nov 200518 Nov 2005

Publication series

Name
PublisherSTW Dutch Technoloy Foundation

Conference

Conference8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2005) & 16th Annual Workshop on Circuits, Systems and Signal Processing (ProRisc 2005); Veldhoven,The Netherlands
Period17/11/0518/11/05

Bibliographical note

Editors onbekend, WPM/STW

Keywords

  • Vakpubl., Overig wet. > 3 pag

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