@inproceedings{9ef1151c783f466a9de383b9f957e1aa,
title = "Structural and electro-optical properties of thin silicon films deposited in the protocrystalline growth regime",
keywords = "Vakpubl., Overig wet. > 3 pag",
author = "{van Elzakker}, G and FD Tichelaar and M Zeman",
note = "Editors onbekend, WPM/STW; 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE 2005) & 16th Annual Workshop on Circuits, Systems and Signal Processing (ProRisc 2005); Veldhoven,The Netherlands ; Conference date: 17-11-2005 Through 18-11-2005",
year = "2005",
language = "Undefined/Unknown",
isbn = "90-73461-50-2",
publisher = "STW Dutch Technoloy Foundation",
pages = "1--5",
editor = "s.n.",
booktitle = "Proceedings of the STW annual workshop on semiconductor advances for future electronics and sensors (SAFE 2005)",
}