Structural characterization and porosity analysis in self-supported porous alumina-silica thin films

THY Tran, H Schut, WG Haije, J Schoonman

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{24110f16a9fb4908a526d8a5bf86df7a,

title = "Structural characterization and porosity analysis in self-supported porous alumina-silica thin films",

keywords = "academic journal papers, CWTS 0.75 <= JFIS < 2.00",

author = "THY Tran and H Schut and WG Haije and J Schoonman",

year = "2011",

doi = "10.1016/j.tsf.2011.06.027",

language = "English",

pages = "30--34",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Structural characterization and porosity analysis in self-supported porous alumina-silica thin films

AU - Tran, THY

AU - Schut, H

AU - Haije, WG

AU - Schoonman, J

PY - 2011

Y1 - 2011

KW - academic journal papers

KW - CWTS 0.75 <= JFIS < 2.00

U2 - 10.1016/j.tsf.2011.06.027

DO - 10.1016/j.tsf.2011.06.027

M3 - Article

SN - 0040-6090

SP - 30

EP - 34

JO - Thin Solid Films

JF - Thin Solid Films

ER -