TY - GEN
T1 - Structural inference of sensor-based measurements
AU - Duin, RPW
AU - Pekalska, EM
PY - 2006
Y1 - 2006
N2 - Statisticalinferenceofsensor-basedmeasurementsisintensivelystudiedinpatternrecognition.Itisusuallybasedonfeaturerepresentationsoftheobjectstoberecognized.Suchrepresentations,however,neglecttheobjectstructure.Structuralpatternrecognition,onthecontrary,focussesonencodingtheobjectstructure.Asgeneralproceduresarestillweaklydeveloped,suchobjectdescriptionsareoftenapplicationdependent.Thishamperstheusageofagenerallearningapproach.
Thispaperaimstosummarizetheproblemsandpossibilitiesofgeneralstructuralinferenceapproachesforthefamilyofsensor-basedmeasurements:images,spectraandtimesignals,assumingacontinuitybetweenmeasurementsamples.Inparticularitwillbediscussedwhenprobabilisticassumptionsareneeded,leadingtoastatistically-basedinferenceofthestructure,andwhenapure,non-probabilisticstructuralinferenceschememaybepossible.
AB - Statisticalinferenceofsensor-basedmeasurementsisintensivelystudiedinpatternrecognition.Itisusuallybasedonfeaturerepresentationsoftheobjectstoberecognized.Suchrepresentations,however,neglecttheobjectstructure.Structuralpatternrecognition,onthecontrary,focussesonencodingtheobjectstructure.Asgeneralproceduresarestillweaklydeveloped,suchobjectdescriptionsareoftenapplicationdependent.Thishamperstheusageofagenerallearningapproach.
Thispaperaimstosummarizetheproblemsandpossibilitiesofgeneralstructuralinferenceapproachesforthefamilyofsensor-basedmeasurements:images,spectraandtimesignals,assumingacontinuitybetweenmeasurementsamples.Inparticularitwillbediscussedwhenprobabilisticassumptionsareneeded,leadingtoastatistically-basedinferenceofthestructure,andwhenapure,non-probabilisticstructuralinferenceschememaybepossible.
KW - Wiskunde en Informatica
KW - Techniek
KW - technische Wiskunde en Informatica
KW - conference contrib. refereed
KW - CWTS 0.75 <= JFIS < 2.00
UR - http://www.springerlink.com/content/el932545n7221215/fulltext.pdf
M3 - Conference contribution
SN - 3-540-37236-9
SP - 41
EP - 55
BT - Structural, syntactic and statistical pattern recognition
A2 - Yeung, DY
A2 - Kwok, JT
A2 - Fred, A
A2 - Roli, F
A2 - de Ridder, D
PB - Springer
CY - Berlin-Heidelberg
T2 - Joint IAPR International Workshops SSPR 2006 and SPR 2006, Hong Kong, China
Y2 - 17 August 2006 through 19 August 2006
ER -