Structural similarity as a method to reduce qualification tests

WD van Driel; GQ Zhang; LJ Ernst

Structural similarity as a method to reduce qualification tests

WD van Driel, GQ Zhang, LJ Ernst

Dynamics of Micro and Nano Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of 2005 6th International Conference on Electronic Packaging Technology
Editors	Keyun, Bi, Chunqing, Wang
Place of Publication	Piscataway, New Jersey
Publisher	IEEE
Pages	647-652
Number of pages	6
ISBN (Print)	0-7803-9449-6
Publication status	Published - 2005
Event	2005 6th International Conference on Electronic Packaging Technology, Shenzhen, China - Piscataway, New Jersey Duration: 30 Aug 2005 → 2 Sept 2005

Publication series

Name
Publisher	IEEE

Conference

Conference	2005 6th International Conference on Electronic Packaging Technology, Shenzhen, China
Period	30/08/05 → 2/09/05

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{ac63ba2ff39949e5991fc472761aafaf,

title = "Structural similarity as a method to reduce qualification tests",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{van Driel}, WD and GQ Zhang and LJ Ernst",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7803-9449-6",

publisher = "IEEE",

pages = "647--652",

editor = "Keyun and Bi and Chunqing and Wang",

booktitle = "Proceedings of 2005 6th International Conference on Electronic Packaging Technology",

address = "United States",

note = "2005 6th International Conference on Electronic Packaging Technology, Shenzhen, China ; Conference date: 30-08-2005 Through 02-09-2005",

}

Structural similarity as a method to reduce qualification tests. / van Driel, WD; Zhang, GQ; Ernst, LJ.
Proceedings of 2005 6th International Conference on Electronic Packaging Technology. ed. / Keyun; Bi; Chunqing; Wang. Piscataway, New Jersey: IEEE, 2005. p. 647-652.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Structural similarity as a method to reduce qualification tests

AU - van Driel, WD

AU - Zhang, GQ

AU - Ernst, LJ

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-9449-6

SP - 647

EP - 652

BT - Proceedings of 2005 6th International Conference on Electronic Packaging Technology

A2 - Keyun, null

A2 - Bi, null

A2 - Chunqing, null

A2 - Wang, null

PB - IEEE

CY - Piscataway, New Jersey

T2 - 2005 6th International Conference on Electronic Packaging Technology, Shenzhen, China

Y2 - 30 August 2005 through 2 September 2005

ER -