Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

PC Snijders, LPH Jeurgens, WG Sloof

    Research output: Contribution to journalArticleScientificpeer-review

    79 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)97-109
    Number of pages13
    JournalSurface Science
    Volume496
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS JFIS < 1.00

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