Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

PC Snijders, LPH Jeurgens, WG Sloof

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{f73027bfc06e4f45bc3af1097f6bb877,

title = "Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS",

keywords = "ZX CWTS JFIS < 1.00",

author = "PC Snijders and LPH Jeurgens and WG Sloof",

year = "2002",

language = "Undefined/Unknown",

volume = "496",

pages = "97--109",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

}