Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC

A Klaver; JM Warman; MP de Haas; JW Metselaar; RACMM van Swaaij

Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC

A Klaver, JM Warman, MP de Haas, JW Metselaar, RACMM van Swaaij

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Amorphous and nanocrystalline silicon science and technology
Editors	M Kondo EA Schiff Ganguly G, R Biswas
Place of Publication	San Francisco
Publisher	Materials Research Society
Pages	165-170
Number of pages	6
Publication status	Published - 2004

Publication series

Name
Publisher	Materials Research Society

Name	Materials Research Society Symposium Proceedings
Volume	808
ISSN (Print)	0272-9172

Keywords

Conf.proc. > 3 pag

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

Klaver, A., Warman, JM., de Haas, MP., Metselaar, JW., & van Swaaij, RACMM. (2004). Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC. In M. K. EA Schiff Ganguly G, & R Biswas (Eds.), Amorphous and nanocrystalline silicon science and technology (pp. 165-170). (Materials Research Society Symposium Proceedings; Vol. 808). Materials Research Society.

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title = "Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC",

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author = "A Klaver and JM Warman and {de Haas}, MP and JW Metselaar and {van Swaaij}, RACMM",

year = "2004",

language = "Undefined/Unknown",

publisher = "Materials Research Society",

pages = "165--170",

editor = "{EA Schiff Ganguly G}, {M Kondo} and {R Biswas}",

booktitle = "Amorphous and nanocrystalline silicon science and technology",

address = "United States",

}

Klaver, A, Warman, JM, de Haas, MP, Metselaar, JW & van Swaaij, RACMM 2004, Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC. in MK EA Schiff Ganguly G & R Biswas (eds), Amorphous and nanocrystalline silicon science and technology. Materials Research Society Symposium Proceedings, vol. 808, Materials Research Society, San Francisco, pp. 165-170.

Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC. / Klaver, A; Warman, JM; de Haas, MP et al.
Amorphous and nanocrystalline silicon science and technology. ed. / M Kondo EA Schiff Ganguly G; R Biswas. San Francisco: Materials Research Society, 2004. p. 165-170 (Materials Research Society Symposium Proceedings; Vol. 808).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC

AU - Klaver, A

AU - Warman, JM

AU - de Haas, MP

AU - Metselaar, JW

AU - van Swaaij, RACMM

PY - 2004

Y1 - 2004

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 165

EP - 170

BT - Amorphous and nanocrystalline silicon science and technology

A2 - EA Schiff Ganguly G, M Kondo

A2 - R Biswas, null

PB - Materials Research Society

CY - San Francisco

ER -