Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

A. V. Vasilieva, N. A. Grigoryeva, A. A. Mistonov, N. A. Sapoletova, K. S. Napolskii, A. A. Eliseev, A. V. Lukashin, Yu D. Tretyakov, W. G. Bouwman, More Authors

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.

Original languageEnglish
Article number012029
JournalJournal of Physics: Conference Series
Volume247
DOIs
Publication statusPublished - 2010

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