@inproceedings{cb7b91c0d6764ae090b647299685bebc,
title = "Study of the defect distribution in a-Si:H during degradation",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "{van Heuvel}, JJG and M Zeman and JW Metselaar",
year = "2000",
language = "Undefined/Unknown",
isbn = "90-73461-24-3",
publisher = "STW Technology Foundation",
pages = "53--59",
editor = "{JP Veen}",
booktitle = "SAFE-ProRISC-SeSens 2000: proceedings",
note = "Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven ; Conference date: 28-11-2001 Through 30-11-2001",
}