Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

KR Koops; R Banning; PMLO Scholte; WC Heerens; JMTA Adriaens; WL de Koning

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

KR Koops, R Banning, PMLO Scholte, WC Heerens, JMTA Adriaens, WL de Koning

Discrete Mathematics and Optimization

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods
Editors	K Hasche, W Mirande, G Wilkening
Pages	32-39
Number of pages	8
Publication status	Published - 1997

Cite this

Koops, KR., Banning, R., Scholte, PMLO., Heerens, WC., Adriaens, JMTA., & de Koning, WL. (1997). Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes. In K. Hasche, W. Mirande, & G. Wilkening (Eds.), Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods (pp. 32-39)

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title = "Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes",

author = "KR Koops and R Banning and PMLO Scholte and WC Heerens and JMTA Adriaens and {de Koning}, WL",

year = "1997",

language = "Undefined/Unknown",

pages = "32--39",

editor = "K Hasche and W Mirande and G Wilkening",

booktitle = "Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods",

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Koops, KR, Banning, R, Scholte, PMLO, Heerens, WC, Adriaens, JMTA & de Koning, WL 1997, Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes. in K Hasche, W Mirande & G Wilkening (eds), Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods. pp. 32-39.

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes. / Koops, KR; Banning, R; Scholte, PMLO et al.

Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods. ed. / K Hasche; W Mirande; G Wilkening. 1997. p. 32-39.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

AU - Koops, KR

AU - Banning, R

AU - Scholte, PMLO

AU - Heerens, WC

AU - Adriaens, JMTA

AU - de Koning, WL

PY - 1997

Y1 - 1997

M3 - Conference contribution

SP - 32

EP - 39

BT - Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods

A2 - Hasche, K

A2 - Mirande, W

A2 - Wilkening, G

ER -

Koops KR, Banning R, Scholte PMLO, Heerens WC, Adriaens JMTA, de Koning WL. Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes. In Hasche K, Mirande W, Wilkening G, editors, Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods. 1997. p. 32-39