Subsurface damage measurements as tool for proces monitoring.

RM Bijl, OW Fähnle, H van Brug

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	The fourteenth ASPE annual meeting.
Editors	Irving F Stowers
Publisher	ASPE
Pages	606-609
Number of pages	4
ISBN (Print)	1-887706-22-4
Publication status	Published - 1999

Name
Publisher	ASPE

Name
Volume	20

Cite this

@inproceedings{e881481abeec48078df135066c60409a,

title = "Subsurface damage measurements as tool for proces monitoring.",

author = "RM Bijl and OW F{\"a}hnle and {van Brug}, H",

year = "1999",

language = "Undefined/Unknown",

isbn = "1-887706-22-4",

publisher = "ASPE",

pages = "606--609",

editor = "Stowers, {Irving F}",

booktitle = "The fourteenth ASPE annual meeting.",

}