Improving the image quality of small particles is a classic problem and especially challenging when the distance between particles are below the optical diffraction limit. We propose a imaging system illuminated with radially polarized light combined with a suitable substrate that contains a thin dielectric layer to demonstrate that the imaging quality can be enhanced. The coupling between the evanescent wave produced in a designed thin dielectric layer, the small particles and the propagating wave forms a mechanism to transfer sub-wavelength information about the particles to the far field. The smallest distinguished distance reaches to 0.634λ, when the imaging system is composed of a high numerical aperture (NA=0.9) lens and the illumination wavelength λ = 632nm, beyond the diffraction limit 0.678λ. The lateral resolution can be further improved by combining the proposed structure with superresolution microscopy techniques.
|Publication status||Published - 2020|