@article{044bcb07ab0b4fcf81f43f16feaa970f,
title = "Surface-charge-layer sheet-resistance measurements for evaluating interface RF losses on high-resistivity-silicon substrates",
author = "SB Evseev and LK Nanver and S Milosaviljevic",
note = "Harvest Article number: 6341879",
year = "2012",
doi = "10.1109/TMTT.2012.2215050",
language = "English",
volume = "60",
pages = "3542--3550",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
number = "11",
}