Surface oxide content examination of capping boron layers in UV photodetectors

V Mohammadi; P Ramachandra Rao; RWE van de Kruijs; S Nihtianov

doi:10.1109/DRC.2015.7175562

Surface oxide content examination of capping boron layers in UV photodetectors

V Mohammadi, P Ramachandra Rao, RWE van de Kruijs, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 73rd Annual Device Research Conference
Editors	SR Bank, D Jena
Place of Publication	Piscataway
Publisher	IEEE
Pages	73-74
Number of pages	2
ISBN (Print)	978-1-4673-8134-5
DOIs	https://doi.org/10.1109/DRC.2015.7175562
Publication status	Published - 2015
Event	DRC 2015, Columbus, USA - Piscataway Duration: 21 Jun 2015 → 24 Jun 2016

Publication series

Name
Publisher	IEEE

Conference

Conference	DRC 2015, Columbus, USA
Period	21/06/15 → 24/06/16

Bibliographical note

harvest

Access to Document

10.1109/DRC.2015.7175562

Cite this

@inproceedings{9453ab8174b44394b779c535c6978585,

title = "Surface oxide content examination of capping boron layers in UV photodetectors",

author = "V Mohammadi and {Ramachandra Rao}, P and {van de Kruijs}, RWE and S Nihtianov",

note = "harvest; DRC 2015, Columbus, USA ; Conference date: 21-06-2015 Through 24-06-2016",

year = "2015",

doi = "10.1109/DRC.2015.7175562",

language = "Undefined/Unknown",

isbn = "978-1-4673-8134-5",

publisher = "IEEE",

pages = "73--74",

editor = "SR Bank and D Jena",

booktitle = "Proceedings of the 73rd Annual Device Research Conference",

address = "United States",

}

Surface oxide content examination of capping boron layers in UV photodetectors. / Mohammadi, V; Ramachandra Rao, P; van de Kruijs, RWE et al.
Proceedings of the 73rd Annual Device Research Conference. ed. / SR Bank; D Jena. Piscataway: IEEE, 2015. p. 73-74.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Surface oxide content examination of capping boron layers in UV photodetectors

AU - Mohammadi, V

AU - Ramachandra Rao, P

AU - van de Kruijs, RWE

AU - Nihtianov, S

N1 - harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/DRC.2015.7175562

DO - 10.1109/DRC.2015.7175562

M3 - Conference contribution

SN - 978-1-4673-8134-5

SP - 73

EP - 74

BT - Proceedings of the 73rd Annual Device Research Conference

A2 - Bank, SR

A2 - Jena, D

PB - IEEE

CY - Piscataway

T2 - DRC 2015, Columbus, USA

Y2 - 21 June 2015 through 24 June 2016

ER -