Surface oxide content examination of capping boron layers in UV photodetectors

V Mohammadi, P Ramachandra Rao, RWE van de Kruijs, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the 73rd Annual Device Research Conference
EditorsSR Bank, D Jena
Place of PublicationPiscataway
PublisherIEEE Society
Pages73-74
Number of pages2
ISBN (Print)978-1-4673-8134-5
DOIs
Publication statusPublished - 2015
EventDRC 2015, Columbus, USA - Piscataway
Duration: 21 Jun 201524 Jun 2016

Publication series

Name
PublisherIEEE

Conference

ConferenceDRC 2015, Columbus, USA
Period21/06/1524/06/16

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