Synthesized pulsed bias for device characterization

AK Manjanna, K Buisman, M Spirito, M Marchetti, M J Pelk, LCN de Vreede

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013
EditorsL Hayden, B Grossman, D Blackham, J Gering
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-146734982-6
DOIs
Publication statusPublished - 2013
EventARFTG 2013, Seattle, WA, USA - Piscataway, NJ, USA
Duration: 7 Jun 20137 Jun 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceARFTG 2013, Seattle, WA, USA
Period7/06/137/06/13

Cite this

Manjanna, AK., Buisman, K., Spirito, M., Marchetti, M., Pelk, M. J., & de Vreede, LCN. (2013). Synthesized pulsed bias for device characterization. In L. Hayden, B. Grossman, D. Blackham, & J. Gering (Eds.), Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013 (pp. 1-4). IEEE Society. https://doi.org/10.1109/ARFTG.2013.6579031