System and method for micro- and nanoelectromechanical sample mass measurement

H Sadeghian Marnani (Inventor), CK Yang (Inventor), F van Keulen (Inventor), JFL Goosen (Inventor), A Bossche (Inventor), PJ French (Inventor)

Research output: Patent

Op naam van TU Delft

Keywords

@misc{e2a0f2bb13214badb8776a02c12dc2c2,

title = "System and method for micro- and nanoelectromechanical sample mass measurement",

keywords = "Geen BTA classificatie, Geen VSNU-classificatie",

author = "{Sadeghian Marnani}, H and CK Yang and {van Keulen}, F and JFL Goosen and A Bossche and PJ French",

note = "Op naam van TU Delft; 2003643; Op naam van TU Delft",

year = "2009",

language = "Undefined/Unknown",

type = "Patent",

}