System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method

Mesfin Seid Ibrahim, Jiajie Fan, Winco K.C. Yung, Zhou Jing, Xuejun Fan, Willem van Driel, Guoqi Zhang

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)
22 Downloads (Pure)

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