Systematic and material independent variation of electrical, optical, and chemical properties of Ln-materials over the Ln-series (Ln-La,Ce,Pr,..., Lu)

E van der Kolk; P Dorenbos

Systematic and material independent variation of electrical, optical, and chemical properties of Ln-materials over the Ln-series (Ln-La,Ce,Pr,..., Lu)

RST/Biomedical Imaging

Research output: Contribution to journal › Conference article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	64690G-1-64690G-9
Journal	Proceedings of SPIE- International Society for Optical Engineering
Volume	6469
Issue number	64690G
Publication status	Published - 2007

Keywords

Peer-lijst tijdschrift

Cite this

@article{69da0a2ee87a4fcaa889f9810b59bf88,

title = "Systematic and material independent variation of electrical, optical, and chemical properties of Ln-materials over the Ln-series (Ln-La,Ce,Pr,..., Lu)",

keywords = "Peer-lijst tijdschrift",

author = "{van der Kolk}, E and P Dorenbos",

year = "2007",

language = "Undefined/Unknown",

volume = "6469",

pages = "64690G--1--64690G--9",

journal = "Proceedings of SPIE- International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

number = "64690G",

}

Systematic and material independent variation of electrical, optical, and chemical properties of Ln-materials over the Ln-series (Ln-La,Ce,Pr,..., Lu). / van der Kolk, E ; Dorenbos, P.
In: Proceedings of SPIE- International Society for Optical Engineering, Vol. 6469, No. 64690G, 2007, p. 64690G-1-64690G-9.

Research output: Contribution to journal › Conference article › Scientific › peer-review

TY - JOUR

T1 - Systematic and material independent variation of electrical, optical, and chemical properties of Ln-materials over the Ln-series (Ln-La,Ce,Pr,..., Lu)

AU - van der Kolk, E

AU - Dorenbos, P

PY - 2007

Y1 - 2007

KW - Peer-lijst tijdschrift

M3 - Conference article

SN - 0277-786X

VL - 6469

SP - 64690G-1-64690G-9

JO - Proceedings of SPIE- International Society for Optical Engineering

JF - Proceedings of SPIE- International Society for Optical Engineering

IS - 64690G

ER -