Technological challenges in defect detection for metal strip; pattern recognition algorithms

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationThe 1st Sino-European Symposium on Quality Control of High-Grade Steel
EditorsG Qing, S Kaiser
Place of PublicationBeijing
PublisherUniversity of Science and Technology Beijing
Pages38-40
Number of pages3
ISBN (Print)geen
Publication statusPublished - 1999

Publication series

Name
PublisherUniversity of Science and Technology Beijing

Cite this

Jonker, PP., Duin, RPW., de Ridder, D., Ligteringen, R., & Tax, DMJ. (1999). Technological challenges in defect detection for metal strip; pattern recognition algorithms. In G. Qing, & S. Kaiser (Eds.), The 1st Sino-European Symposium on Quality Control of High-Grade Steel (pp. 38-40). University of Science and Technology Beijing.