TEM investigation of excimer-laser recrystallised Si layers with a crystalline seed in the underlaying Si-oxide, 0%, 50%, 70% and 90% laser transmissions

    Research output: Book/ReportReportProfessional

    Original languageUndefined/Unknown
    Place of PublicationDelft
    PublisherTechnische Universiteit Delft
    Number of pages7
    Publication statusPublished - 2002

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    PublisherTUD

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