TEM study of defects in the Mg-doped bulk GaN crystals.

JA Kozubowski, J Borysiuk, HW Zandbergen, J Grezegory, JL Weyher, S Porowski

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 10th Conference on Electron Microscopy of Solids.
    Number of pages6
    Publication statusPublished - 1999

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