Temporal Noise Reduction in CMOS Image Sensors

X. Ge

doi:10.4233/uuid:386c834b-a534-4c0e-8710-1234cfd6bd9e

Temporal Noise Reduction in CMOS Image Sensors

X. Ge

Electronic Instrumentation

Research output: Thesis › Dissertation (TU Delft)

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Abstract

In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics.

Original language	English
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Theuwissen, A.J.P.A.M., Supervisor
Award date	15 Sept 2021
Print ISBNs	978-94-6416-807-5
DOIs	https://doi.org/10.4233/uuid:386c834b-a534-4c0e-8710-1234cfd6bd9e
Publication status	Published - 2021

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title = "Temporal Noise Reduction in CMOS Image Sensors",

abstract = "In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics. ",

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AB - In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics.

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M3 - Dissertation (TU Delft)

SN - 978-94-6416-807-5

ER -

Temporal Noise Reduction in CMOS Image Sensors

Abstract

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