Test-driving Intel Xeon Phi

J Fang, C Xu, HJ Sips, Y Che, L Zhang, AL Varbanescu

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

65 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 5th ACM/SPEC International Conference on Performance Engineering (ICPE 2014)
EditorsKD Lange, J Murphy
Place of PublicationNew York, NY, USA
PublisherAssociation for Computing Machinery (ACM)
Pages137-148
Number of pages12
ISBN (Print)978-1-4503-2733-6
DOIs
Publication statusPublished - 2014
EventACM/SPEC ICPE 2014, Dublin, Ireland - New York, NY, USA
Duration: 22 Mar 201426 Mar 2014

Publication series

Name
PublisherACM

Conference

ConferenceACM/SPEC ICPE 2014, Dublin, Ireland
Period22/03/1426/03/14

Cite this

Fang, J., Xu, C., Sips, HJ., Che, Y., Zhang, L., & Varbanescu, AL. (2014). Test-driving Intel Xeon Phi. In KD. Lange, & J. Murphy (Eds.), Proceedings of the 5th ACM/SPEC International Conference on Performance Engineering (ICPE 2014) (pp. 137-148). Association for Computing Machinery (ACM). https://doi.org/10.1145/2568088.2576799