@article{489f6d486aef46759f9103a6c6df3c70,
title = "Test generation and optimization for DRAM cell defects using electrical simulation",
keywords = "Elektrotechniek, Techniek, ZX CWTS JFIS < 1.00",
author = "Z Al-Ars and {van de Goor}, AJ",
year = "2003",
language = "Undefined/Unknown",
volume = "22",
pages = "1371--1384",
journal = "IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems",
issn = "0278-0070",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
number = "10",
}