Test point insertion for compact test sets

MJ Geuzebroek, JT van Linden, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

32 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationInternational tests conference 2000: proceedings
Place of PublicationLos Alamitos
PublisherIEEE
Pages292-301
Number of pages10
ISBN (Print)0-7803-6546-1
Publication statusPublished - 2000
EventInternational tests conference. ITC 2000, Atlantic City - Los Alamitos
Duration: 3 Oct 20005 Oct 2000

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceInternational tests conference. ITC 2000, Atlantic City
Period3/10/005/10/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

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