Test point insertion that facilitates ATPG in reducing test time and data volume

MJ Geuzebroek, JT van Linden, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

42 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings International Test Conference 2002
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages138-148
Number of pages11
ISBN (Print)0-7803-7542-4
Publication statusPublished - 2002
EventInternational Test Conference 2002 - Piscataway, NJ, USA
Duration: 8 Oct 200210 Oct 2002

Publication series

Name
PublisherIEEE

Conference

ConferenceInternational Test Conference 2002
Period8/10/0210/10/02

Keywords

  • Elektrotechniek
  • Techniek
  • ZX Nader te bep. ivm conversie
  • ZX Int.klas.verslagjaar < 2002

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