Test point insertion to improve BIST performance and to reduce ATPG test time and data volume

MJ Geuzebroek

Research output: ThesisDissertation (TU Delft)

Original languageUndefined/Unknown
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
  • van de Goor, AJ, Supervisor
Award date19 May 2003
Place of PublicationDelft
Print ISBNs90-407-2412-1
Publication statusPublished - 2003


  • Diss. prom. aan TU Delft

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