Test set development for cache memory in modern microprocessors

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)725-732
Number of pages8
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume16
Issue number6
Publication statusPublished - 2008

Keywords

  • Elektrotechniek
  • Techniek
  • academic journal papers
  • CWTS 0.75 <= JFIS < 2.00

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