Testability and fault tolerance for emerging nanoelectronic memories

NZB Haron

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Bertels, K.L.M., Supervisor
Award date9 May 2012
Place of PublicationDelft
Print ISBNs978 90 72298 28 7
Publication statusPublished - 2012

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