| Original language | English |
|---|---|
| Qualification | Doctor of Philosophy |
| Awarding Institution |
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| Supervisors/Advisors |
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| Award date | 9 May 2012 |
| Place of Publication | Delft |
| Print ISBNs | 978 90 72298 28 7 |
| Publication status | Published - 2012 |
Testability and fault tolerance for emerging nanoelectronic memories
NZB Haron
Research output: Thesis › Dissertation (TU Delft)