Testing for Parasitic Memory Effect in SRAMs

IS Irobi, Z Al-Ars, S Hamdioui, C Thibeault

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

47 Citations (Scopus)
Original languageEnglish
Title of host publication20th IEEE Asian Test Symposium 2011
EditorsA Chatterjee, A Patra, S Kundu, S Ravi
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-0-7695-4583-7
DOIs
Publication statusPublished - 2011
EventATS 2011 - Piscataway, NJ, USA
Duration: 20 Nov 201123 Nov 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceATS 2011
Period20/11/1123/11/11

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