Testing methods for PUF-based secure key storage circuits

AMMO Cortez, G Roelofs, S Hamdioui, G. di Natale

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)581-594
Number of pages14
JournalJournal of Electronic Testing: theory and applications
Volume30
Issue number5
DOIs
Publication statusPublished - 2014

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