Testing of modern semiconductors memory structures

Research output: ThesisDissertation (TU Delft)

Original languageUndefined/Unknown
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Beenakker, C.I.M., Supervisor
Award date25 Sep 2007
Place of PublicationDelft
Publisher
Print ISBNs978-90-9022223-3
Publication statusPublished - 2007

Keywords

  • other publications
  • Diss. prom. aan TU Delft

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