Testing open defects in memristor-based memories

Research output: Contribution to journal › Article › Scientific › peer-review

80 Citations (Scopus)

Original language	English
Pages (from-to)	247-259
Number of pages	13
Journal	IEEE Transactions on Computers
Volume	64
Issue number	1
DOIs	https://doi.org/10.1109/TC.2013.206
Publication status	Published - 2016

Published online 18 October 2013

Access to Document

@article{caa6a38a85594f9680d2ff3f7d3f11bd,

title = "Testing open defects in memristor-based memories",

author = "S Hamdioui and M Taouil and NZB Haron",

note = "Published online 18 October 2013",

year = "2016",

doi = "10.1109/TC.2013.206",

language = "English",

volume = "64",

pages = "247--259",

journal = "IEEE Transactions on Computers",

issn = "0018-9340",

publisher = "IEEE",

number = "1",

}