Testing open defects in memristor-based memories

S Hamdioui, M Taouil, NZB Haron

Research output: Contribution to journalArticleScientificpeer-review

52 Citations (Scopus)
Original languageEnglish
Pages (from-to)247-259
Number of pages13
JournalIEEE Transactions on Computers
Volume64
Issue number1
DOIs
Publication statusPublished - 2016

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