Testing open defects in memristor-based memories

S Hamdioui; M Taouil; NZB Haron

doi:10.1109/TC.2013.206

Testing open defects in memristor-based memories

S Hamdioui, M Taouil, NZB Haron

Computer Engineering

Research output: Contribution to journal › Article › Scientific › peer-review

97 Citations (Scopus)

Original language	English
Pages (from-to)	247-259
Number of pages	13
Journal	IEEE Transactions on Computers
Volume	64
Issue number	1
DOIs	https://doi.org/10.1109/TC.2013.206
Publication status	Published - 2016

Bibliographical note

Published online 18 October 2013

Access to Document

10.1109/TC.2013.206

Cite this

@article{caa6a38a85594f9680d2ff3f7d3f11bd,

title = "Testing open defects in memristor-based memories",

author = "S Hamdioui and M Taouil and NZB Haron",

note = "Published online 18 October 2013",

year = "2016",

doi = "10.1109/TC.2013.206",

language = "English",

volume = "64",

pages = "247--259",

journal = "IEEE Transactions on Computers",

issn = "0018-9340",

publisher = "IEEE",

number = "1",

}

TY - JOUR

T1 - Testing open defects in memristor-based memories

AU - Hamdioui, S

AU - Taouil, M

AU - Haron, NZB

N1 - Published online 18 October 2013

PY - 2016

Y1 - 2016

UR - https://www.scopus.com/pages/publications/84919633222

U2 - 10.1109/TC.2013.206

DO - 10.1109/TC.2013.206

M3 - Article

SN - 0018-9340

VL - 64

SP - 247

EP - 259

JO - IEEE Transactions on Computers

JF - IEEE Transactions on Computers

IS - 1

ER -

Testing open defects in memristor-based memories

Bibliographical note

Access to Document

Other files and links

Cite this