Testing static and dynamic faults in random access memories

S Hamdioui, Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

85 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication20th VLSI Test symposium; Proceedings
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages395-401
Number of pages7
ISBN (Print)0-7695-1570-3
Publication statusPublished - 2002
Event20th VLSI Test symposium - Piscataway, NJ, USA
Duration: 28 Apr 20022 May 2002

Publication series

Name
PublisherIEEE

Conference

Conference20th VLSI Test symposium
Period28/04/022/05/02

Keywords

  • ZX Nader te bep. ivm conversie
  • ZX Int.klas.verslagjaar < 2002

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