Testing static and dynamic faults in random access memories

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

107 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	20th VLSI Test symposium; Proceedings
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	395-401
Number of pages	7
ISBN (Print)	0-7695-1570-3
Publication status	Published - 2002
Event	20th VLSI Test symposium - Piscataway, NJ, USA Duration: 28 Apr 2002 → 2 May 2002

Name
Publisher	IEEE

Conference	20th VLSI Test symposium
Period	28/04/02 → 2/05/02

Keywords

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title = "Testing static and dynamic faults in random access memories",

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author = "S Hamdioui and Z Al-Ars and {van de Goor}, AJ",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7695-1570-3",

publisher = "IEEE Society",

pages = "395--401",

booktitle = "20th VLSI Test symposium; Proceedings",

note = "20th VLSI Test symposium ; Conference date: 28-04-2002 Through 02-05-2002",

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TY - GEN

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AU - Hamdioui, S

AU - Al-Ars, Z

AU - van de Goor, AJ

PY - 2002

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KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1570-3

SP - 395

EP - 401

BT - 20th VLSI Test symposium; Proceedings

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 20th VLSI Test symposium

Y2 - 28 April 2002 through 2 May 2002

ER -