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Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
L. Wu
Computer Engineering
Research output
:
Thesis
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Dissertation (TU Delft)
1039
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Overview
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Dive into the research topics of 'Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions'. Together they form a unique fingerprint.
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Engineering
Fault Model
100%
Test Solution
100%
Defects
100%
Testing
100%
High Quality
22%
Customers
11%
Models
11%
SPICE
11%
Robust Design
11%
Resistive
11%
Interconnects
11%
Performance
11%
Ferromagnet
11%
Density
11%
Gas Fuel Manufacture
11%
Mass Production
11%
Product
11%
Internals
11%
Circuit Simulation
11%
Abstraction Level
11%
Magnetic Couplings
11%
INIS
manufacturing
100%
testing
100%
defects
100%
solutions
100%
devices
22%
design
11%
production
11%
levels
11%
coverings
11%
intermediate state
11%
coupling
11%
simulation
11%
silicon
11%
spices
11%
density
11%
cost
11%
performance
11%
industry
11%
data
11%
Biochemistry, Genetics and Molecular Biology
Solution and Solubility
100%
Density
25%
Magnetism
25%
Keyphrases
MRAM Devices
14%
Intermittent Fault
14%
Efficient Manufacturing
14%