Tests for address decoder delay faults in RAMs due to inter-gate opens

AJ van de Goor, S Hamdioui, Z Al-Ars

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the 9th IEEE European Test Symposium
Place of PublicationLos Alamitos
PublisherIEEE
Pages146-153
Number of pages8
ISBN (Print)0-7695-2119-3
Publication statusPublished - 2004
Event9th IEEE European Test Symposium, Ajaccio, France - Los Alamitos
Duration: 23 May 200426 May 2004

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference9th IEEE European Test Symposium, Ajaccio, France
Period23/05/0426/05/04

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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