Tests for resistive and capacitive defects in address decoders

M Klaus, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

25 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings
Editors DC Young
Place of PublicationLos Alamitos
PublisherIEEE
Pages31-36
Number of pages6
ISBN (Print)0-7695-1378-6
Publication statusPublished - 2001
Event10th Asian Test Symposium, Kyoto - Los Alamitos
Duration: 19 Nov 200121 Nov 2001

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference10th Asian Test Symposium, Kyoto
Period19/11/0121/11/01

Keywords

  • ZX Int.klas.verslagjaar < 2002

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