Tests for resistive and capacitive defects in address decoders

M Klaus; AJ van de Goor Ph D

Tests for resistive and capacitive defects in address decoders

M Klaus, AJ van de Goor Ph D

Delft University of Technology

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

28 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings
Editors	DC Young
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	31-36
Number of pages	6
ISBN (Print)	0-7695-1378-6
Publication status	Published - 2001
Event	10th Asian Test Symposium, Kyoto - Los Alamitos Duration: 19 Nov 2001 → 21 Nov 2001

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	10th Asian Test Symposium, Kyoto
Period	19/11/01 → 21/11/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

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title = "Tests for resistive and capacitive defects in address decoders",

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year = "2001",

language = "Undefined/Unknown",

isbn = "0-7695-1378-6",

publisher = "IEEE",

pages = "31--36",

editor = "\{DC Young\}",

booktitle = "Proceedings",

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note = "10th Asian Test Symposium, Kyoto ; Conference date: 19-11-2001 Through 21-11-2001",

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TY - GEN

T1 - Tests for resistive and capacitive defects in address decoders

AU - Klaus, M

AU - van de Goor Ph D, AJ

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

UR - https://www.scopus.com/pages/publications/0035701537

M3 - Conference contribution

SN - 0-7695-1378-6

SP - 31

EP - 36

BT - Proceedings

A2 - DC Young, null

PB - IEEE

CY - Los Alamitos

T2 - 10th Asian Test Symposium, Kyoto

Y2 - 19 November 2001 through 21 November 2001

ER -

Tests for resistive and capacitive defects in address decoders

Publication series

Conference

Keywords

Other files and links

Cite this