The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination

J Jansen

The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the microscopy and microanalysis 2002 meeting
Editors	E Voelkl, D Piston, R Gauvin, AJ Lockley, GW Baily, S McKernan
Place of Publication	Cambridge
Publisher	Press Syndicate of the University of Cambridge
Pages	102-103
Number of pages	2
Publication status	Published - 2002
Event	Microscopy and Microanalysis 2002 meeting - Cambridge Duration: 5 Aug 2002 → 8 Aug 2002

Publication series

Name
Publisher	Press Syndicate of the University of Cambridge

Name	Microscopy and Microanalysis
Volume	8
ISSN (Print)	1431-9276

Conference

Conference	Microscopy and Microanalysis 2002 meeting
Period	5/08/02 → 8/08/02

Keywords

Geen BTA classificatie

Cite this

Jansen, J. (2002). The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination. In E. Voelkl, D. Piston, R. Gauvin, AJ. Lockley, GW. Baily, & S. McKernan (Eds.), Proceedings of the microscopy and microanalysis 2002 meeting (pp. 102-103). (Microscopy and Microanalysis; Vol. 8). Press Syndicate of the University of Cambridge.

Jansen, J. / The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination. Proceedings of the microscopy and microanalysis 2002 meeting. editor / E Voelkl ; D Piston ; R Gauvin ; AJ Lockley ; GW Baily ; S McKernan. Cambridge : Press Syndicate of the University of Cambridge, 2002. pp. 102-103 (Microscopy and Microanalysis).

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title = "The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination",

keywords = "Geen BTA classificatie",

author = "J Jansen",

year = "2002",

language = "Undefined/Unknown",

publisher = "Press Syndicate of the University of Cambridge",

pages = "102--103",

editor = "E Voelkl and D Piston and R Gauvin and AJ Lockley and GW Baily and S McKernan",

booktitle = "Proceedings of the microscopy and microanalysis 2002 meeting",

note = "Microscopy and Microanalysis 2002 meeting ; Conference date: 05-08-2002 Through 08-08-2002",

}

Jansen, J 2002, The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination. in E Voelkl, D Piston, R Gauvin, AJ Lockley, GW Baily & S McKernan (eds), Proceedings of the microscopy and microanalysis 2002 meeting. Microscopy and Microanalysis, vol. 8, Press Syndicate of the University of Cambridge, Cambridge, pp. 102-103, Microscopy and Microanalysis 2002 meeting, 5/08/02.

The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination. / Jansen, J.
Proceedings of the microscopy and microanalysis 2002 meeting. ed. / E Voelkl; D Piston; R Gauvin; AJ Lockley; GW Baily; S McKernan. Cambridge: Press Syndicate of the University of Cambridge, 2002. p. 102-103 (Microscopy and Microanalysis; Vol. 8).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination

AU - Jansen, J

PY - 2002

Y1 - 2002

KW - Geen BTA classificatie

M3 - Conference contribution

SP - 102

EP - 103

BT - Proceedings of the microscopy and microanalysis 2002 meeting

A2 - Voelkl, E

A2 - Piston, D

A2 - Gauvin, R

A2 - Lockley, AJ

A2 - Baily, GW

A2 - McKernan, S

PB - Press Syndicate of the University of Cambridge

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T2 - Microscopy and Microanalysis 2002 meeting

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