The accuracy of crystal structure refinement from electron diffraction data using parallel beam illumination

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the microscopy and microanalysis 2002 meeting
    EditorsE Voelkl, D Piston, R Gauvin, AJ Lockley, GW Baily, S McKernan
    Place of PublicationCambridge
    PublisherPress Syndicate of the University of Cambridge
    Pages102-103
    Number of pages2
    Publication statusPublished - 2002
    EventMicroscopy and Microanalysis 2002 meeting - Cambridge
    Duration: 5 Aug 20028 Aug 2002

    Publication series

    Name
    PublisherPress Syndicate of the University of Cambridge
    NameMicroscopy and Microanalysis
    Volume8
    ISSN (Print)1431-9276

    Conference

    ConferenceMicroscopy and Microanalysis 2002 meeting
    Period5/08/028/08/02

    Keywords

    • Geen BTA classificatie

    Cite this