@inproceedings{fbf20aaabf7f465380ad8ee4c7041363,
title = "The benefits of statistical experimental design for quantitative electron microscopy",
keywords = "Geen BTA classificatie",
author = "{van Aert}, S and {den Dekker}, AJ and {van den Bos}, A and {Van Dyck}, D",
note = "ISSN 0-620-29294-6; 15th International Congress on Electron Microscopy, Durban ; Conference date: 01-09-2002 Through 06-09-2002",
year = "2002",
language = "Undefined/Unknown",
publisher = "Microscopy Society of Southern Africa, Onderstepoort",
pages = "189--190",
editor = "{R. Cross}",
booktitle = "Proceedings of the 15th International Congress on Electron Microscopy",
}