The benefits of statistical experimental design for quantitative electron microscopy

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 15th International Congress on Electron Microscopy
    Editors R. Cross
    Place of PublicationDurban
    PublisherMicroscopy Society of Southern Africa, Onderstepoort
    Pages189-190
    Number of pages2
    Publication statusPublished - 2002
    Event15th International Congress on Electron Microscopy, Durban - Durban
    Duration: 1 Sep 20026 Sep 2002

    Publication series

    Name
    PublisherMicroscopy Society of Southern Africa, Onderstepoort
    Name
    Volume3

    Conference

    Conference15th International Congress on Electron Microscopy, Durban
    Period1/09/026/09/02

    Bibliographical note

    ISSN 0-620-29294-6

    Keywords

    • Geen BTA classificatie

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