The characterization of classification problems by classifier disagreements

RPW Duin; EM Pekalska; DMJ Tax

The characterization of classification problems by classifier disagreements

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

12 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	ICPR2004; Proceedings of the 17th international conference on pattern recognition
Editors	J Kittler, M Petrou, M Nixon
Place of Publication	Los Alamitos
Publisher	IEEE Society
Pages	140-143
Number of pages	4
ISBN (Print)	0-7695-2128-2
Publication status	Published - 2004
Event	17th International conference on pattern recognition, Cambridge, UK - Los Alamitos Duration: 23 Aug 2004 → 26 Aug 2004

Publication series

Name
Publisher	IEEE

Name
Volume	1

Conference

Conference	17th International conference on pattern recognition, Cambridge, UK
Period	23/08/04 → 26/08/04

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{116ffe27c74240cf8f62c6569d562bd7,

title = "The characterization of classification problems by classifier disagreements",

keywords = "Conf.proc. > 3 pag",

author = "RPW Duin and EM Pekalska and DMJ Tax",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7695-2128-2",

publisher = "IEEE Society",

pages = "140--143",

editor = "J Kittler and M Petrou and M Nixon",

booktitle = "ICPR2004; Proceedings of the 17th international conference on pattern recognition",

note = "null ; Conference date: 23-08-2004 Through 26-08-2004",

}

The characterization of classification problems by classifier disagreements. / Duin, RPW; Pekalska, EM; Tax, DMJ.

ICPR2004; Proceedings of the 17th international conference on pattern recognition. ed. / J Kittler; M Petrou; M Nixon. Los Alamitos : IEEE Society, 2004. p. 140-143.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The characterization of classification problems by classifier disagreements

AU - Duin, RPW

AU - Pekalska, EM

AU - Tax, DMJ

PY - 2004

Y1 - 2004

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2128-2

SP - 140

EP - 143

BT - ICPR2004; Proceedings of the 17th international conference on pattern recognition

A2 - Kittler, J

A2 - Petrou, M

A2 - Nixon, M

PB - IEEE Society

CY - Los Alamitos

Y2 - 23 August 2004 through 26 August 2004

ER -