The determination of specimen orientation and thickness on a nanometer scale from exit waves.

Regina Bokel, J Jansen, HW Zandbergen, D Van Dyck

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 14th International Congress on Electron Microscopy.
    EditorsHA Calderon Benavides, M Jose Yacaman
    Number of pages2
    Publication statusPublished - 1998

    Publication series

    NameMaterials Science
    ISSN (Print)1068-820X

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