The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

VJ Ghosh, B Nielsen, AC Kruseman, PE Mijnarends, A van Veen, KG Lynn

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{de0bac661d474f47bb8063c7fced6b55,

title = "The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "VJ Ghosh and B Nielsen and AC Kruseman and PE Mijnarends and {van Veen}, A and KG Lynn",

year = "1999",

language = "Undefined/Unknown",

volume = "149",

pages = "234--237",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

}

TY - JOUR

T1 - The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

AU - Ghosh, VJ

AU - Nielsen, B

AU - Kruseman, AC

AU - Mijnarends, PE

AU - van Veen, A

AU - Lynn, KG

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0169-4332

VL - 149

SP - 234

EP - 237

JO - Applied Surface Science

JF - Applied Surface Science

ER -