@inproceedings{7aa4f74dd857480ba4359f023d3a3ca9,
title = "The effectiveness of Scan test and its new variants",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "{van de Goor}, AJ and S Hamdioui and Z Al-Ars",
year = "2004",
language = "Undefined/Unknown",
isbn = "0-7695-2193-2",
publisher = "IEEE ",
pages = "26--31",
editor = "FM Titsworth",
booktitle = "Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004",
address = "United States",
note = "2004 International workshop on Memory Technology, Design and Technology, San Jose, USA ; Conference date: 09-08-2004 Through 10-08-2004",
}