The influence of mechanical stresses on the characteristics of bipolar transistors

F Jun, S Mijalkovic, WJ Eysenga, HW van Zeijl, W Crans

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationSAFE2000 CD-ROM
Place of PublicationUtrecht
PublisherSTW Technology Foundation
Pages79-85
Number of pages7
ISBN (Print)90-73461-24-3
Publication statusPublished - 2000
EventWorkshop on Semiconductor Advances for Future Electronics, Veldhoven - Utrecht
Duration: 29 Nov 200030 Nov 2000

Publication series

Name
PublisherSTW technology foundation

Conference

ConferenceWorkshop on Semiconductor Advances for Future Electronics, Veldhoven
Period29/11/0030/11/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

Cite this

Jun, F., Mijalkovic, S., Eysenga, WJ., van Zeijl, HW., & Crans, W. (2000). The influence of mechanical stresses on the characteristics of bipolar transistors. In SAFE2000 CD-ROM (pp. 79-85). STW Technology Foundation.