The influence of mechanical stresses on the characteristics of bipolar transistors

F Jun, S Mijalkovic, WJ Eysenga, HW van Zeijl, W Crans

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	SAFE2000 CD-ROM
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	79-85
Number of pages	7
ISBN (Print)	90-73461-24-3
Publication status	Published - 2000
Event	Workshop on Semiconductor Advances for Future Electronics, Veldhoven - Utrecht Duration: 29 Nov 2000 → 30 Nov 2000

Name
Publisher	STW technology foundation

Conference	Workshop on Semiconductor Advances for Future Electronics, Veldhoven
Period	29/11/00 → 30/11/00

Cite this

Jun, F., Mijalkovic, S., Eysenga, WJ., van Zeijl, HW., & Crans, W. (2000). The influence of mechanical stresses on the characteristics of bipolar transistors. In SAFE2000 CD-ROM (pp. 79-85). STW Technology Foundation.

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title = "The influence of mechanical stresses on the characteristics of bipolar transistors",

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author = "F Jun and S Mijalkovic and WJ Eysenga and {van Zeijl}, HW and W Crans",

year = "2000",

language = "Undefined/Unknown",

isbn = "90-73461-24-3",

publisher = "STW Technology Foundation",

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booktitle = "SAFE2000 CD-ROM",

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TY - GEN

T1 - The influence of mechanical stresses on the characteristics of bipolar transistors

AU - Jun, F

AU - Mijalkovic, S

AU - Eysenga, WJ

AU - van Zeijl, HW

AU - Crans, W

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 90-73461-24-3

SP - 79

EP - 85

BT - SAFE2000 CD-ROM

PB - STW Technology Foundation

CY - Utrecht

Y2 - 29 November 2000 through 30 November 2000

ER -