The influence of stacking faults on the leakage current of b-layer p+n diodes

N Golshani, WB De Boer, TLM Scholtes, A Sakic, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010
Editors	P French et al
Place of Publication	Utrecht, The Netherlands
Publisher	STW
Pages	81-84
Number of pages	4
Publication status	Published - 2010
Event	13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands - Utrecht, The Netherlands Duration: 18 Nov 2010 → 19 Nov 2010

Name
Publisher	STW

Conference	13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands
Period	18/11/10 → 19/11/10

Keywords

@inproceedings{6929afbdd9334fb5ae321709b5969d66,

title = "The influence of stacking faults on the leakage current of b-layer p+n diodes",

keywords = "Conf.proc. > 3 pag",

author = "N Golshani and {De Boer}, WB and TLM Scholtes and A Sakic and LK Nanver",

year = "2010",

language = "English",

publisher = "STW",

pages = "81--84",

editor = "{French et al}, P",

booktitle = "Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010",

note = "13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands ; Conference date: 18-11-2010 Through 19-11-2010",

}

The influence of stacking faults on the leakage current of b-layer p+n diodes. / Golshani, N; De Boer, WB; Scholtes, TLM et al.
Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010. ed. / P French et al. Utrecht, The Netherlands: STW, 2010. p. 81-84.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The influence of stacking faults on the leakage current of b-layer p+n diodes

AU - Golshani, N

AU - De Boer, WB

AU - Scholtes, TLM

AU - Sakic, A

AU - Nanver, LK

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 81

EP - 84

BT - Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010

A2 - French et al, P

PB - STW

CY - Utrecht, The Netherlands

T2 - 13th SAFE Workshop STW.ICT Conference 2010, Veldhoven, the Netherlands

Y2 - 18 November 2010 through 19 November 2010

ER -