The Last Line Effect

Moritz Beller, Andy Zaidman, Andrey Karpov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

10 Citations (Scopus)
25 Downloads (Pure)

Abstract

Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE 23rd International Conference on Program Comprehension, ICPC 2015
PublisherIEEE
Pages240-243
Number of pages4
Volume2015-August
ISBN (Electronic)978-14673-8159-8
DOIs
Publication statusPublished - 2015
Event23rd IEEE International Conference on Program Comprehension, ICPC 2015 - Florence, Italy
Duration: 18 May 201519 May 2015

Conference

Conference23rd IEEE International Conference on Program Comprehension, ICPC 2015
CountryItaly
CityFlorence
Period18/05/1519/05/15

Keywords

  • Code Clones
  • Defects
  • Last Line Effect
  • Last Statement Effect
  • Micro-clone

Cite this

Beller, M., Zaidman, A., & Karpov, A. (2015). The Last Line Effect. In Proceedings - 2015 IEEE 23rd International Conference on Program Comprehension, ICPC 2015 (Vol. 2015-August, pp. 240-243). [7181452] IEEE. https://doi.org/10.1109/ICPC.2015.34