Abstract
Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2015 IEEE 23rd International Conference on Program Comprehension, ICPC 2015 |
| Publisher | IEEE |
| Pages | 240-243 |
| Number of pages | 4 |
| Volume | 2015-August |
| ISBN (Electronic) | 978-14673-8159-8 |
| DOIs | |
| Publication status | Published - 2015 |
| Event | 23rd IEEE International Conference on Program Comprehension, ICPC 2015 - Florence, Italy Duration: 18 May 2015 → 19 May 2015 |
Conference
| Conference | 23rd IEEE International Conference on Program Comprehension, ICPC 2015 |
|---|---|
| Country/Territory | Italy |
| City | Florence |
| Period | 18/05/15 → 19/05/15 |
Bibliographical note
Accepted Author ManuscriptKeywords
- Code Clones
- Defects
- Last Line Effect
- Last Statement Effect
- Micro-clone
Fingerprint
Dive into the research topics of 'The Last Line Effect'. Together they form a unique fingerprint.Prizes
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Best ERA paper award
Beller, Moritz (Recipient), Zaidman, A.E. (Recipient) & Karpov, Andrey (Recipient), 2015
Prize: Prize (including medals and awards)